Title :
ISFET´s with ion-sensitive membranes fabricated by ion implantation
Author :
Ito, Tadashi ; Inagaki, Hazime ; Igarashi, Isemi
Author_Institution :
Toyota Central Res. & Dev. Labs., Aichi, Japan
fDate :
1/1/1988 12:00:00 AM
Abstract :
Ion sensitive FETs (ISFETs) for sodium ions (Na+) fabricated by ion-implantation are investigated. The sensing layers are produced by implanting Na+ ions into the surface of an oxidized Si3N4 layer through an Al buffer layer deposited beforehand, in order to reduce the damage to the gate insulator of the ISFET during ion implantation. The Na+ sensitivity, selectivity, repeatability, thermal characteristics, and long-term stability are evaluated. The ISFET responds to Na+ ions independent of pH within the range of pH 7-10, and the Na+ sensitivity is nearly Nernstian. The ISFETs repeatability and long-term stability (about 1300 h), suggests that the ion-implantation technique is a suitable method for fabricating a stable ion-sensing layer
Keywords :
chemical variables measurement; electric sensing devices; insulated gate field effect transistors; ion implantation; 1300 h; Al buffer layer; ISFETs; Na+ sensitivity; Si-SiO2-Si3N4; ion implantation; ion sensitive FET; ion-sensitive membranes; long-term stability; repeatability; selectivity; thermal characteristics; Artificial intelligence; Biomembranes; Electrodes; Fabrication; Glass; Indium tin oxide; Insulation; Ion implantation; Thermal stability; Windows;
Journal_Title :
Electron Devices, IEEE Transactions on