• DocumentCode
    963808
  • Title

    InGaAs superconducting JFETs with Nb electrodes

  • Author

    Kleinsasser, A.W. ; Jackson, Thomas N. ; McInturff, D. ; Rammo, F. ; Woodall, Jerry M.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2628
  • Abstract
    Summary form only given. The authors have fabricated InGaAs junction FETs with Nb source and drain electrodes with submicrometer spacings. The devices exhibit gate-controlled supercurrents as large as 8 mA/mm at 4.2 K. This value of controlled supercurrent is larger than any previously reported for superconducting field-effect devices. The channel material was n-type In0.53Ga0.47As, epitaxially grown by molecular beam epitaxy on InP substrates. Gate control was achieved using a p-n junction which was buried below the channel. This structure allowed the Nb superconductor to be deposited directly onto the freshly grown channel layer to insure a clean superconductor-semiconductor contact, which is essential for obtaining optimum superconducting properties. The superconducting electrodes were patterned by reactive ion etching.
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; junction gate field effect transistors; substrates; superconducting junction devices; 4.2 K; InGaAs-Nb; InP substrates; Nb electrodes; gate-controlled supercurrents; junction FETs; molecular beam epitaxy; p-n junction; reactive ion etching; semiconductors; submicrometer spacings; superconducting JFETs; superconducting field-effect devices; superconductor-semiconductor contact; Electrodes; Indium gallium arsenide; Indium phosphide; JFETs; Josephson junctions; Molecular beam epitaxial growth; Niobium; Superconducting devices; Superconducting epitaxial layers; Superconducting materials;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43757
  • Filename
    43757