DocumentCode :
963893
Title :
Linear dimensionality reduction via a heteroscedastic extension of LDA: the Chernoff criterion
Author :
Duin, Robert P W ; Loog, Marco
Volume :
26
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
732
Lastpage :
739
Abstract :
We propose an eigenvector-based heteroscedastic linear dimension reduction (LDR) technique for multiclass data. The technique is based on a heteroscedastic two-class technique which utilizes the so-called Chernoff criterion, and successfully extends the well-known linear discriminant analysis (LDA). The latter, which is based on the Fisher criterion, is incapable of dealing with heteroscedastic data in a proper way. For the two-class case, the between-class scatter is generalized so to capture differences in (co)variances. It is shown that the classical notion of between-class scatter can be associated with Euclidean distances between class means. From this viewpoint, the between-class scatter is generalized by employing the Chernoff distance measure, leading to our proposed heteroscedastic measure. Finally, using the results from the two-class case, a multiclass extension of the Chernoff criterion is proposed. This criterion combines separation information present in the class mean as well as the class covariance matrices. Extensive experiments and a comparison with similar dimension reduction techniques are presented.
Keywords :
covariance matrices; data reduction; eigenvalues and eigenfunctions; feature extraction; pattern classification; Chernoff criterion; Chernoff distance measure; Euclidean distances; Fisher criterion; covariance matrices; feature extraction; heteroscedastic extension; linear dimensionality reduction; linear discriminant analysis; multiclass data; Arithmetic; Covariance matrix; Density measurement; Distributed decision making; Euclidean distance; Feature extraction; Linear discriminant analysis; Pattern recognition; Scattering; Chernoff criterion.; Chernoff distance; Fisher criterion; Linear dimension reduction; linear discriminant analysis; Algorithms; Artificial Intelligence; Computer Simulation; Information Storage and Retrieval; Linear Models; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2004.13
Filename :
1288523
Link To Document :
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