Title :
Some Aspects of Satellite and Space Probe Reliability
Author :
Gross, T.W. ; Werner, H.C.
Author_Institution :
Missiles and Space Div., Lockheed Aircraft Corp., Sunnyvale, Calif.
Abstract :
It is becoming a recognized fact that many of the electronic piece parts used in present day ballistic missile and space probes are inadequate for the long-life space programs of the near future. Realization of the major differences of life and reliability requirements resulting from short and long term exposures to the space environment has led to a four point plan for the establishment of an acceptable class of parts that will meet the more rigid demands. Presented here are the plan and some of the preliminary results obtained to date.
Keywords :
Capacitance; Capacitors; Life testing; Missiles; Probes; Quality control; Satellites; Seals; Solids; Temperature;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1961.5009571