DocumentCode
964300
Title
Testing of digital systems
Author
Siewiorek, Daniel P. ; Lai, Larry Kwok-Woon
Author_Institution
Carnegie-Mellon University, Pittsburgh, PA
Volume
69
Issue
10
fYear
1981
Firstpage
1321
Lastpage
1333
Abstract
This paper is intended to be both a tutorial on hardware testing and a brief survey of existing techniques. Testing is discussed at all levels in the digital system hierarchy as well as at every stage of a system\´s life. The paper is organized into three parts. In the first part, fundamental concepts are presented. The second part reviews various testing techniques, with special emphasis on those that have gained wide acceptance. Finally, design techniques which promise to produce "easily testable" hardware are explored.
Keywords
Circuit faults; Counting circuits; Digital systems; Hardware; Mass production; Resistors; System testing; Terminology; Voltage; Wiring;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1981.12169
Filename
1456437
Link To Document