• DocumentCode
    964300
  • Title

    Testing of digital systems

  • Author

    Siewiorek, Daniel P. ; Lai, Larry Kwok-Woon

  • Author_Institution
    Carnegie-Mellon University, Pittsburgh, PA
  • Volume
    69
  • Issue
    10
  • fYear
    1981
  • Firstpage
    1321
  • Lastpage
    1333
  • Abstract
    This paper is intended to be both a tutorial on hardware testing and a brief survey of existing techniques. Testing is discussed at all levels in the digital system hierarchy as well as at every stage of a system\´s life. The paper is organized into three parts. In the first part, fundamental concepts are presented. The second part reviews various testing techniques, with special emphasis on those that have gained wide acceptance. Finally, design techniques which promise to produce "easily testable" hardware are explored.
  • Keywords
    Circuit faults; Counting circuits; Digital systems; Hardware; Mass production; Resistors; System testing; Terminology; Voltage; Wiring;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1981.12169
  • Filename
    1456437