Title :
Characterisation of avalanche photodiodes having nearly-unilateral-carrier multiplication
Author :
Mouthaan, K. ; Snoeren, R.M.
Author_Institution :
Philips Research Laboratories, Eindhoven, Netherlands
Abstract :
Theoretical and experimental results for the output noise spectral density of avalanche photodiodes with nearly-unilateral-carrier multiplication are combined to obtain both the quantum efficiency and the noise factor from noise measurements over the operating range of multiplication factors. A noise factor of 2+0.012 M is reported for a silicon diode.
Keywords :
avalanche diodes; optical communication equipment; photodiodes; Si diode; avalanche diodes; avalanche photodiodes; noise spectral density; optical communication equipment;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740091
