Title :
A new external bit field observation method
Author :
Tagami, Katsumichi ; Suganuma, Yoji ; Nagao, Morimasa
Author_Institution :
Nippon Electric Company, Ltd., Kawasaki, Japan
fDate :
9/1/1977 12:00:00 AM
Abstract :
A new method of observing external bit fields emanating from recorded media is proposed. Fields are magnetically transcribed to a magnetic film located some distance from a recording surface and are observed by means of Lorentz microscopy. Some observed field patterns are shown, and the magnetic flux flows are analyzed.
Keywords :
Electron microscopy; Magnetic measurements; Magnetic recording/recording materials; Coercive force; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic flux; Magnetic force microscopy; Magnetic heads; Magnetic materials; Magnetic recording; Optical recording;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1977.1059643
