DocumentCode :
964431
Title :
Noise margin criteria for digital logic circuits
Author :
Hauser, John R.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Volume :
36
Issue :
4
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
363
Lastpage :
368
Abstract :
Techniques for evaluating the noise margin for families of digital logic circuits are discussed and evaluated. It is shown that the technique of evaluating the -1 slope points on the inverter transfer function as used in most modern textbooks is not a valid and reliable approach to evaluating noise margin values. It is argued that the most reliable and reasonable criterion is to maximize the product of the two noise margins. This is equivalent to maximizing the area of a rectangle embedded within the loop formed by the transfer curves of an inverter pair. Most of the material presented can be found in the early literature on noise margin. However, because of the widespread use of the -1 slope criterion in modern textbooks, it is believed that a reexamination of basic approaches to noise margins is in order
Keywords :
electron device noise; invertors; logic circuits; transfer functions; -1 slope points; digital logic circuits; inverter transfer function; noise margin; Circuit noise; Helium; Logic circuits; Logic gates; Noise figure; Noise level; Pulse inverters; Solids; Temperature distribution; Voltage;
fLanguage :
English
Journal_Title :
Education, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/13.241612
Filename :
241612
Link To Document :
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