DocumentCode
964615
Title
Computerized Analysis of Burst Noise in Thick Film Resistors
Author
Cottle, James G. ; Chen, Charles T M
Author_Institution
University of South Florida, Tampa, FL, USA
Volume
6
Issue
2
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
163
Lastpage
167
Abstract
A burst noise (popcorn noise) spectral measurement technique based on digital power spectrum estimation is presented. Application of this technique to thick film resistor burst noise is discussed. Several cases of thick film resistor burst noise are presented and analyzed.
Keywords
Measurement noise; Noise measurement; Spectral analysis; Thick-film circuit measurements; Thick-film circuit noise; Thick-film resistors; Fluctuations; Frequency; Low-frequency noise; Measurement techniques; Noise level; Noise measurement; Pulse measurements; Resistors; Spectral analysis; Thick films;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1983.1136172
Filename
1136172
Link To Document