Title :
Noise in Digital-to-Analog Conversion Due to Bit Errors
Author_Institution :
College of Engineering University of California Davis, Calif.
fDate :
3/1/1965 12:00:00 AM
Keywords :
Degradation; Digital-analog conversion; Error analysis; Information theory; Intersymbol interference; Parity check codes; Phase change materials; Power generation; Signal to noise ratio; Telemetry;
Journal_Title :
Space Electronics and Telemetry, IEEE Transactions on
DOI :
10.1109/TSET.1965.5009637