Title :
Microwave Hall-mobility measurements on vanadium bronze V2O5 (Na0.33V2O5 and Cu0.0083V2O5)
Author :
Sayed, M.M. ; Perlstein, J.H.
Author_Institution :
Microwave Technology Center, Palo Alto, USA
Abstract :
The Hall mobilities of two examples of vanadium-bronze are reported using microwave techniques. The hopping conduction mechanism is confirmed for the copper-vanadium-bronze by comparing the d.c. conductivity and mobility to the microwave conductivity and mobility.
Keywords :
Hall effect; carrier mobility; hopping conduction; microwave measurement; vanadium compounds; CU0.0083 V2O5; Hall effect; Hopping conduction; Na0.33 V2O5; carrier mobility; microwave Hall mobility; microwave measurement; vanadium compounds;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740136
