DocumentCode :
964878
Title :
Firing Studies With a Model Thick Film Resistor System
Author :
Lee, Joon ; Vest, Robert W.
Author_Institution :
Purdue University, West Lafayette, IN, USA
Volume :
6
Issue :
4
fYear :
1983
fDate :
12/1/1983 12:00:00 AM
Firstpage :
430
Lastpage :
435
Abstract :
A model resistor system consisting of RuO2 and a single glass was used to study the effects of heating rate, maximum temperature, and Iaolding time at maximum temperature on sheet resistance and temperature dependence of resistance. It was shown that proper selection of the firing parameters can yield good quality resistors having predetermined properties without the use ot´ any chemical additives. The results were used to test theoretical models of charge transport, and it was shown that none of the available models can correlate the wide range of properties resulting from the varying firing conditions.
Keywords :
Thick-film device fabrication; Thick-film resistors; Conducting materials; Firing; Glass; Ink; Laser stability; Resistors; Temperature dependence; Thermal resistance; Thermal stability; Thick films;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1983.1136198
Filename :
1136198
Link To Document :
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