DocumentCode
964878
Title
Firing Studies With a Model Thick Film Resistor System
Author
Lee, Joon ; Vest, Robert W.
Author_Institution
Purdue University, West Lafayette, IN, USA
Volume
6
Issue
4
fYear
1983
fDate
12/1/1983 12:00:00 AM
Firstpage
430
Lastpage
435
Abstract
A model resistor system consisting of RuO2 and a single glass was used to study the effects of heating rate, maximum temperature, and Iaolding time at maximum temperature on sheet resistance and temperature dependence of resistance. It was shown that proper selection of the firing parameters can yield good quality resistors having predetermined properties without the use ot´ any chemical additives. The results were used to test theoretical models of charge transport, and it was shown that none of the available models can correlate the wide range of properties resulting from the varying firing conditions.
Keywords
Thick-film device fabrication; Thick-film resistors; Conducting materials; Firing; Glass; Ink; Laser stability; Resistors; Temperature dependence; Thermal resistance; Thermal stability; Thick films;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1983.1136198
Filename
1136198
Link To Document