Title :
Notation describing the fault-related behaviour of logic modules
Author_Institution :
University of Southampton, Department of Electronics, Southampton, UK
Abstract :
This letter describes a new notation, inspired by Roth´s concept of `D cubes¿, of use in test-sequence generation for digital circuits. The notation identifies three modes of behaviour for logic modules (subcircuits): faultless operation, fault-effect generation and fault-effect transmission.
Keywords :
digital circuits; logic circuits; modules; testing; modules;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740164
