• DocumentCode
    965352
  • Title

    Gap-tolerant half-disk bubble device margins

  • Author

    Almasi, George S.

  • Author_Institution
    IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y.
  • Volume
    14
  • Issue
    2
  • fYear
    1978
  • fDate
    3/1/1978 12:00:00 AM
  • Firstpage
    40
  • Lastpage
    45
  • Abstract
    A simple model is presented which allows accurate prediction of bias margins of gap-tolerant half-disk propagation tracks for bubble domains. After this is verified by comparison with experimental margin data, an "isomargin" plot is derived to show how the margin varies as a function of W and G , where W is the minimum linewidth and G is the inter-bar gap. The bias margin is shown to decrease along a fairly straight line which goes to zero when W + G equals the runout diameter, i.e., when W+G \\approx 1.5 W_{s} , where Wsis the bubble stripwidth or average bubble diameter. This agrees with experiment, and means that the minimum resolvable feature for half-disk type patterns must be less than 0.75W_{s} , and probably will not be much larger than 0.5W_{s} to 0.6W_{s} . It is concluded that, if made with perfect Permalloy, T-bars and half-disks should propagate isolated bubbles equally well. The advantages of half-disks over T-bars are 1) the fatal bar-crossing problem of T-bars with multiple bubbles is avoided, 2) the minimum propagation field is lower than for T-bars, and 3) half-disks seem more tolerant of "bad" (e.g., high-coercivity) Permalloy. Also tabulated are the effects on margins of variations in the device parameters of a representative design, as might be encountered in a fabrication process with finite tolerances. A brief discussion of stop-start margins is given in conclusion.
  • Keywords
    Magnetic bubble devices; Analytical models; Fabrication; Geometry; Helium; Magnetic circuits; Magnetic domains; Shape; Solid modeling; Thumb; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1978.1059735
  • Filename
    1059735