Electrical characterization and modeling of alternating-current thin-film electroluminescent devices

Author

Davidson, James D. ; Wager, John F. ; Khormaei, Ron I. ; King, Christopher N. ; Williams, Richard

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

Volume

39

Issue

5

fYear

1992

fDate

5/1/1992 12:00:00 AM

Firstpage

1122

Lastpage

1128

Abstract

Electrical characterization of evaporated ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is accomplished by capacitance-voltage (C-V) analysis. Interpretation of these C-V characteristics is aided by SPICE modeling and by electrical characterization of an ideal ACTFEL device constructed from discrete components, based on a simple equivalent circuit for the ACTFEL device. Various features of the C -V curve are ascribed to equivalent circuit parameters and associated device physics parameters

Keywords

II-VI semiconductors; capacitance; electroluminescent displays; equivalent circuits; manganese; semiconductor device models; zinc compounds; ACTFEL; C-V characteristics; SPICE; ZnS:Mn; alternating-current thin-film electroluminescent; capacitance voltage characteristics; device physics; driver waveform; electrical characterization; equivalent circuit parameters; modeling; semiconductors; Capacitance; Capacitance-voltage characteristics; Electroluminescent devices; Equivalent circuits; Pulse shaping methods; Resistors; Thin film circuits; Thin film devices; Voltage; Zinc compounds;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.129092

Filename

129092