DocumentCode :
965868
Title :
Scattering matrix simulation of electron transport in model bipolar devices
Author :
Das, Amitava ; Lundstrom, Mark S.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
39
Issue :
5
fYear :
1992
fDate :
5/1/1992 12:00:00 AM
Firstpage :
1157
Lastpage :
1163
Abstract :
The scattering matrix approach is a new technique for solving the Boltzmann transport equation in semiconductor devices. The authors extend the technique so that it can treat the very low electric fields and energy barriers often found in devices. Applications of the new technique to advanced device simulation are demonstrated by simulating a model silicon p-n junction and bipolar transistor. The results demonstrate that the scattering matrix approach can resolve the position-dependent distribution function in advanced devices
Keywords :
S-matrix theory; bipolar transistors; p-n homojunctions; semiconductor device models; Boltzmann transport equation; Si p-n junction; advanced devices; device simulation; electron transport; energy barriers; low electric fields; model bipolar devices; position-dependent distribution function; scattering matrix approach; semiconductor devices; Bipolar transistors; Boltzmann equation; Distribution functions; Electrons; Energy barrier; Energy resolution; P-n junctions; Scattering; Semiconductor devices; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.129097
Filename :
129097
Link To Document :
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