• DocumentCode
    965966
  • Title

    Microstructures for control of multiple ion or electron beams

  • Author

    Jones, Gary W. ; Jones, Susan K. ; Walters, Mark D. ; Dudley, Bruce W.

  • Author_Institution
    Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2686
  • Lastpage
    2692
  • Abstract
    Structures have been fabricated with the potential to provide multiple particle beam control for high-speed direct-write lithography with the potential of gigahertz date rates and 0.1- mu m pixel sizes. The principal device structure consists of an array of apertures capable of supporting individual deflectors that is built into monolithic single-crystal silicon substrate. The construction of versions of these structures with very small 0.08- mu m apertures and with aperture/Einsel lens combinations has been demonstrated. Far-submicrometer (<0.10 mu m) resist structures have been printed using wand apertures fabricated by oxidizing silicon orifices. The performance of such a prototype lithography system using wand lens arrays has been projected to have a 3.84-GHz effective data rate and under 1-min writing times of high-density patterns on 100-mm wafers. Key aspects of fabrication of the microstructure are described.
  • Keywords
    electron beam lithography; electron lenses; electron optics; electrostatic lenses; ion beam lithography; ion optics; 0.08 micron; Si orifice oxidation; aperture/Einsel lens combinations; direct-write lithography; electron beams; electrostatic deflectors; high-density patterns; ion beams; microstructure fabrication; multiple particle beam control; prototype lithography system; single crystal Si substrate; wand apertures; wand lens arrays; Apertures; Electron beams; Lenses; Lithography; Microstructure; Orifices; Particle beams; Resists; Silicon; Size control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43773
  • Filename
    43773