• DocumentCode
    966133
  • Title

    Computer Aided Design for Large-Scale Integrated Circuits

  • Author

    Lynn, D.K.

  • Volume
    5
  • Issue
    3
  • fYear
    1972
  • Firstpage
    36
  • Lastpage
    45
  • Abstract
    The complexity of integrated circuits has increased steadily over the past several years from circuits consisting of simple gates through Medium Scale Integration (MSI) and Large Scale Integration (LSI). Fabrication techniques for LSI have evolved from well-established integrated circuit technology. Because of the large physical size and the large number of components on the individual silicon die, production techniques have been substantially improved in order to maintain reasonable yields. However, the most significant effects of LSI on the semiconductor manufacturer are in the areas of design and testing; techniques used in the past for simpler integrated circuits are inadequate for LSI.
  • Keywords
    Circuit testing; Fabrication; Integrated circuit manufacture; Integrated circuit technology; Integrated circuit testing; Integrated circuit yield; Large scale integration; Production; Semiconductor device manufacture; Silicon;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/C-M.1972.216915
  • Filename
    1641549