DocumentCode
966133
Title
Computer Aided Design for Large-Scale Integrated Circuits
Author
Lynn, D.K.
Volume
5
Issue
3
fYear
1972
Firstpage
36
Lastpage
45
Abstract
The complexity of integrated circuits has increased steadily over the past several years from circuits consisting of simple gates through Medium Scale Integration (MSI) and Large Scale Integration (LSI). Fabrication techniques for LSI have evolved from well-established integrated circuit technology. Because of the large physical size and the large number of components on the individual silicon die, production techniques have been substantially improved in order to maintain reasonable yields. However, the most significant effects of LSI on the semiconductor manufacturer are in the areas of design and testing; techniques used in the past for simpler integrated circuits are inadequate for LSI.
Keywords
Circuit testing; Fabrication; Integrated circuit manufacture; Integrated circuit technology; Integrated circuit testing; Integrated circuit yield; Large scale integration; Production; Semiconductor device manufacture; Silicon;
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/C-M.1972.216915
Filename
1641549
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