DocumentCode :
966406
Title :
Self-Checking Carry-Select Adder Design Based on Two-Rail Encoding
Author :
Vasudevan, Dilip P. ; Lala, Parag K. ; Parkerson, James P.
Author_Institution :
Univ. of Edinburgh, Edinburgh
Volume :
54
Issue :
12
fYear :
2007
Firstpage :
2696
Lastpage :
2705
Abstract :
Carry-select adders are one of the faster types of adders. This paper proposes a scheme that encodes the sum bits using two-rail codes; the encoded sum bits are then checked by self-checking checkers. The multiplexers used in the adder are also totally self-checking. The scheme is illustrated with the implementation of a 2-bit carry select adder that can detect all single stuck-at faults on-line; the detection of double faults is not guaranteed. Adders of arbitrary size can be constructed by cascading the appropriate number of such 2-bit adders. A range of adders from 4 to 128 bits is designed using this approach employing a 0.5-mum CMOS technology. The transistor overhead in implementing these self-checking adders varies from 19.51% to 20.94%, and the area overhead varies from 16.07% to 20.67% compared to adders without built-in self-checking capability.
Keywords :
adders; digital arithmetic; encoding; logic design; 2-bit adder; CMOS technology; online fault detection; self-checking carry-select adder design; transient faults; two-rail encoding; Adders; Arithmetic; CMOS technology; Circuit faults; Delay; Electrical fault detection; Encoding; Fault detection; Multiplexing; Very large scale integration; On-line fault detection; on-line fault detection; self-checking checker; transient faults; two-rail code;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2007.910537
Filename :
4378222
Link To Document :
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