Title :
Magnetic hysteresis characteristics in Fe-SiO2 multilayered films
Author :
Honda, S. ; Ohtsu, M. ; Kusuda, T.
Author_Institution :
Dept. of Phys. Electron., Hiroshima Univ., Japan
fDate :
9/1/1989 12:00:00 AM
Abstract :
The crystallinity and magnetic properties of Fe-SiO2 multilayered films are examined in the range of 7-300 Å Fe layer thickness, dFe, and 2-250 Å SiO2 layer thickness, d(SiO2). The saturation magnetization decreases steeply with dFe below 30 Å for films with d(SiO2)⩾6.3 Å owing to the change in crystallinity of the Fe layers. When d(SiO2) decreases, the magnetic hysteresis loop changes from one characteristic of in-plane magnetization to one characteristic of perpendicular magnetization as a result of the induced perpendicular anisotropy, Ku. The change in K u is explained by the variation of the magnetostatic energy stored in the layer boundaries
Keywords :
induced anisotropy (magnetic); iron; magnetic hysteresis; magnetic thin films; silicon compounds; Fe-SiO2 multilayer films; crystallinity; induced perpendicular anisotropy; magnetic hysteresis loop; magnetostatic energy; saturation magnetisation; Crystallization; Electrons; Iron; Magnetic films; Magnetic hysteresis; Magnetic properties; Radio frequency; Saturation magnetization; Sputtering; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
