DocumentCode
966808
Title
Development of a Novel Resistor System for Nitrogen Firing Applications
Author
Hankey, Dana L. ; Fisher, Clark K.
Author_Institution
Heraeus Cermalloy Inc., West Conshohocken, PA
Volume
7
Issue
4
fYear
1984
fDate
12/1/1984 12:00:00 AM
Firstpage
417
Lastpage
422
Abstract
A novel resistor system compatible with both a copper conductor and a low K dielectric formulation has been under development as a result of an increased interest in such a system. In this paper, which is essentially a current progress report, the capabilities of this system as they have progressed to date are defined. A processing study addressing the effect of peak firing temperature on resultant resistor properties yielded superior performance at 850°C. The properties monitored include sheet resistivity, hot and cold TCR,
TCR, VCR, and aspect ratio tracking. Laser trim drift data and long term drift data as a function of elevated temperature and humidity are presented for unencapsulated and encapsulated trimmed resistors. Topographic and cross-sectional microstructural features of this system were studied using backscattered electron imaging (BEI) with a scanning electron microscope (SEM) and X-ray microanalysis (XRM).
TCR, VCR, and aspect ratio tracking. Laser trim drift data and long term drift data as a function of elevated temperature and humidity are presented for unencapsulated and encapsulated trimmed resistors. Topographic and cross-sectional microstructural features of this system were studied using backscattered electron imaging (BEI) with a scanning electron microscope (SEM) and X-ray microanalysis (XRM).Keywords
Thick-film resistors; Conductivity; Conductors; Copper; Dielectrics; Firing; Monitoring; Nitrogen; Resistors; Scanning electron microscopy; Temperature;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1984.1136383
Filename
1136383
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