• DocumentCode
    966962
  • Title

    A Piezo-Powered Floating-Gate Sensor Array for Long-Term Fatigue Monitoring in Biomechanical Implants

  • Author

    Lajnef, N. ; Elvin, N.G. ; Chakrabartty, S.

  • Author_Institution
    Dept. of Civil & Environ. Eng., Michigan State Univ., East Lansing, MI
  • Volume
    2
  • Issue
    3
  • fYear
    2008
  • Firstpage
    164
  • Lastpage
    172
  • Abstract
    Measurement of the cumulative loading statistics experienced by an implant is essential for prediction of long-term fatigue failure. However, the total power that can be harvested using typical in-vivo strain levels is less than 1 muW. In this paper, we present a novel method for long-term, battery-less fatigue monitoring by integrating piezoelectric transduction with hot-electron injection on a floating-gate transistor array. Measured results from a fabricated prototype in a 0.5-mum CMOS process demonstrate that the array can sense, compute, and store loading statistics for over 70000 stress-strain cycles which can be extended to beyond 107 cycles. The measured response also shows excellent agreement with a theoretical model and the nominal power dissipation of the array has been measured to be less than 800 nW.
  • Keywords
    CMOS integrated circuits; biomedical electronics; fatigue testing; piezoelectric transducers; prosthetics; sensor arrays; strain sensors; CMOS process; biomechanical implant; cumulative loading statistics Measurement; floating-gate transistor array; hot-electron injection; long-term fatigue monitoring; piezo-powered floating-gate sensor array; piezoelectric transduction; self-powered sensing; strain sensors; stress-strain cycle; Biosensors; Capacitive sensors; Condition monitoring; Fatigue; Implants; Power measurement; Secondary generated hot electron injection; Sensor arrays; Statistics; Stress measurement; Biomechanics; fatigue; piezoelectric transducers; self-powered sensing; strain sensors;
  • fLanguage
    English
  • Journal_Title
    Biomedical Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1932-4545
  • Type

    jour

  • DOI
    10.1109/TBCAS.2008.2001473
  • Filename
    4660320