Title :
Surface Micromachined Microelectromechancial Ohmic Series Switch Using Thin-Film Piezoelectric Actuators
Author :
Polcawich, Ronald G. ; Pulskamp, Jeffrey S. ; Judy, Daniel ; Ranade, Prashant ; Trolier-McKinstry, Susan ; Dubey, Madan
Author_Institution :
U.S. Army Res. Lab., Adelphi
Abstract :
This paper presents results on a surface micromachined RF microelectromechanical switch that uses piezoelectric actuators. The switch uses solution chemistry-derived lead zirconate titanate thin films spun deposited onto a high-resistivity silicon substrate with coplanar waveguide transmission lines. Actuation voltages, applied via circuits independent of the RF circuitry, average less than 10 V, with switch operation demonstrated as low as 2 V. The series switch exhibits better than 20-dB isolation from dc up to 65 GHz and as large as 70 dB below 1 GHz. In the closed state, the switch has an insertion loss less than 1 dB up to 40 GHz, limited in this demonstration by substrate losses from the elastic layer used to stress control the piezoelectric actuators. Switching speeds for the different designs are in the range of 40-60 ms. Thermal sensitivity measurements show no change in isolation observed for temperatures up to 125degC. However, an increase in actuation voltage is required at elevated temperatures.
Keywords :
coplanar transmission lines; coplanar waveguides; lead compounds; micromachining; microswitches; piezoelectric actuators; PZT; RF MEMS switch; RF circuitry; actuation voltages; coplanar waveguide transmission lines; high-resistivity silicon substrate; insertion loss; lead zirconate titanate thin films; surface micromachined RF microelectromechanical switch; surface micromachined microelectromechanical ohmic series switch; thermal sensitivity measurements; thin-film piezoelectric actuators; Piezoelectric actuators; Piezoelectric films; Radio frequency; Substrates; Switches; Switching circuits; Temperature sensors; Thin film circuits; Titanium compounds; Voltage; Lead zirconate titanate (PZT); RF microelectromechanical system (MEMS); piezoelectric; reliability; switch; switching speed; temperature sensitivity;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2007.910072