• DocumentCode
    967012
  • Title

    An Output Buffer for 3.3-V Applications in a 0.13- \\mu\\hbox {m} 1/2.5-V CMOS Process

  • Author

    Chen, Shih-Lun ; Ker, Ming-Dou

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu
  • Volume
    54
  • Issue
    1
  • fYear
    2007
  • Firstpage
    14
  • Lastpage
    18
  • Abstract
    With a 3.3-V interface, such as PCI-X application, high-voltage overstress on the gate oxide is a serious reliability problem in designing I/O circuits by using only 1/2.5-V low-voltage devices in a 0.13-mum CMOS process. Thus, a new output buffer realized with low-voltage (1- and 2.5-V) devices to drive high-voltage signals for 3.3-V applications is proposed in this paper. The proposed output buffer has been fabricated in a 0.13-mum 1/2.5-V 1P8M CMOS process with Cu interconnects. The experimental results have confirmed that the proposed output buffer can be successfully operated at 133 MHz without suffering high-voltage gate-oxide overstress in the 3.3-V interface. In addition, a new level converter that is realized with only 1- and 2.5-V devices that can convert 0/1-V voltage swing to 1/3.3-V voltage swing is also presented in this paper. The experimental results have also confirmed that the proposed level converter can be operated correctly
  • Keywords
    CMOS integrated circuits; buffer circuits; convertors; integrated circuit design; integrated circuit reliability; 0.13 micron; 1 V; 133 MHz; 2.5 V; 3.3 V; CMOS process; Cu interconnects; PCI-X application; gate-oxide reliability; high-voltage gate-oxide overstress; level converter; output buffer; Breakdown voltage; CMOS process; Digital circuits; Energy consumption; Hot carrier effects; Integrated circuit interconnections; MOSFET circuits; Manufacturing processes; P-n junctions; Power supplies; Gate-oxide reliability; level converter; mixed-voltage I/O; output buffer;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2006.883202
  • Filename
    4063459