DocumentCode :
967275
Title :
Planar GaAs normally-off j.f.e.t. for high speed logic circuits
Author :
Kato, Y. ; Dohsen, M. ; Kasahara, J. ; Watanabe, N.
Author_Institution :
Sony Corporation, Research Center, Yokohama, Japan
Volume :
16
Issue :
21
fYear :
1980
Firstpage :
821
Lastpage :
822
Abstract :
Planar GaAs j.f.e.t.s in the normally-off mode were fabricated by direct selective ion implantation into a semi-insulating Cr-doped substrate for n-type active regions and selective Zn diffusion for p-type gate areas. The p-n junction gate, typically 2 ¿m in length and 20 ¿m in width, was formed without appreciable anomalous lateral diffusion. A 15-stage ring oscillator formed with resistor-f.e.t. logic gates exhibited a propagation delay time of 73 ps per stage with a power-delay product of 320 fJ. The minimum power-delay product was 5.6 fJ with delay time of 163 ps.
Keywords :
III-V semiconductors; field effect integrated circuits; gallium arsenide; integrated logic circuits; ion implantation; junction gate field effect transistors; Cr doping; GaAs JFET; III-V semiconductor; Zn diffusion; delay time; logic circuits; ring oscillator; selective ion implantation;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19800584
Filename :
4245355
Link To Document :
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