Title :
Tunnel Film Resistance Utilizing Nonlinear Constriction Resistance Measurements
Author :
Bock, E.M. ; Whitley, J.H.
Author_Institution :
AMP Inc.,Harrisburh,Pennsylvania
fDate :
3/1/1971 12:00:00 AM
Abstract :
Constriction resistance measurements based on non-linearity tend to ignore tunnel films because of the ohmic behavior and temperature insensitivity of tunnel resistance. Theory and experimental verification are given to show that tunnel films can be detected and measured by comparing conventional contact resistance measurements with constriction resistance values obtained with the non-linearity technique.
Keywords :
Anodes; Contact resistance; Electrical resistance measurement; Electrodes; Electrons; Insulation; Temperature; Thick films; Tunneling; Voltage;
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
DOI :
10.1109/TPMP.1971.1136438
