• DocumentCode
    967611
  • Title

    Arc Commutation Across a Step or a Gap in One of Two Parallel Copper Electrodes

  • Author

    Widmann, Walter

  • Author_Institution
    Technical University of Vienna, Austria
  • Volume
    8
  • Issue
    1
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    21
  • Lastpage
    28
  • Abstract
    This experimental investigation concerns the commutation of magnetically blown switching arcs up to 1 kA from a contact to an are runner, i.e., across an obstacle formed by a step downwards or by a gap in one of two parallel copper electrodes. The commutation delay of the arc was measured with the aid of an optoelectronical light detector. To obtain also detailed information about the arc commutation mechanism, both an optoelectronical analog arc motion indicator and a streak camera were used. The arc commutation delay depends mainly on the magnetic induction of the blast field, the geometry of the electrode step, and the site where the commutation takes place. The arc commutation behavior across gaps corresponds to that across steps. For both steps and gaps a polarity effect of the commutation mechanism was observed. In most cases an obstacle on the anode causes a shorter commutation delay than one on the cathode. The cathode spot always moves continuously downwards along the vertical front surface of a step or a gap, while the anode spot is able to jump across any obstacle without climbing downwards along its vertical face. All results can be qualitatively derived from an intuitive arc model which might be used to explain unexpected test results and to improve contact arrangements. Finally practical conclusions are drawn.
  • Keywords
    Commutated circuits; Interrupters; Magnetic-blast circuit breakers; Anodes; Cameras; Cathodes; Copper; Delay; Electrodes; Geometry; Magnetic field measurement; Magnetic switching; Testing;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1985.1136465
  • Filename
    1136465