DocumentCode
967932
Title
FDTD analysis of high frequency electronic interconnection effects
Author
Cherry, Paul C. ; Iskander, Magdy F.
Author_Institution
Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA
Volume
43
Issue
10
fYear
1995
fDate
10/1/1995 12:00:00 AM
Firstpage
2445
Lastpage
2451
Abstract
A full-wave analysis of coupled high-frequency interconnect discontinuities is presented using the finite-difference time-domain (FDTD) method. The electromagnetic effects of two via holes on microstrip lines in close proximity to one another are examined and equivalent circuits are presented. The effects of two adjacent lines with bond wires, used, for example, to connect a die to the leadframe of an integrated circuit (IC) package are also analyzed. Frequency domain results are presented by using the discrete Fourier transform of the time-domain results. Guidelines regarding the effective use of the FDTD code including the use a priori calculated electric field distribution in the excitation plane, and the use of a weighted εr,eff to minimize reflections at the absorbing boundaries are described. The obtained FDTD results and the developed equivalent circuit models show the importance of radiation effects at frequencies beyond 20-30 GHz, the possibilities of reducing the inductive effect of bond wires by using two parallel bond wires instead of one, and the importance of including mutual inductance elements in the equivalent circuit model to account for the crosstalk between parallel vias across a ground plane
Keywords
crosstalk; discrete Fourier transforms; equivalent circuits; finite difference time-domain analysis; inductance; integrated circuit interconnections; integrated circuit packaging; microstrip discontinuities; transmission line theory; DFT; FDTD analysis; HF electronic interconnection effects; IC package; adjacent lines; bond wires; crosstalk; discrete Fourier transform; electric field distribution; electromagnetic effects; equivalent circuits; finite-difference time-domain method; full-wave analysis; high frequency interconnection effect; inductive effect; integrated circuit package; interconnect discontinuities; microstrip lines; mutual inductance elements; radiation effects; via holes; Bonding; Coupling circuits; Equivalent circuits; Finite difference methods; Frequency; Integrated circuit interconnections; Integrated circuit packaging; Microstrip; Time domain analysis; Wires;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.466178
Filename
466178
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