• DocumentCode
    968357
  • Title

    TAB Versus Wire Bond-Relative Thermal Performance

  • Author

    Mahalingam, Mali ; Andrew, James A.

  • Author_Institution
    Motorola Inc., Phoenix, AZ
  • Volume
    8
  • Issue
    4
  • fYear
    1985
  • fDate
    12/1/1985 12:00:00 AM
  • Firstpage
    490
  • Lastpage
    499
  • Abstract
    There has been a resurgence of interest in tape automated bonding (TAB) as a method of interconnection between the chip and the substrate in recent years. Proponents of TAB have claimed superior thermal performance for TAB bonded packages compared to wire bonded packages. However, little experimental evidence for such claims existed. Described are experiments and theoretical modeling done on Wire bonded and TAB bonded packages under free air, forced air, and conduction cooling for various die attach methods. For packages mounted on cold plates where \\theta jc(i.e., internal thermal resistance of the package) dominates the thermal behavior of the package, TAB bonded packages were found to have slightly lower thermal resistance than wire bonded packages. For PCB- and socket-mounted packages dissipating heat in natural or forced-air cooling where \\theta ca(i.e., external thermal resistance) dominates the thermal behavior of the package, TAB bonded and wire bonded packages were found to have about the same thermal performance.
  • Keywords
    Integrated circuit bonding; Integrated circuit thermal factors; Bonding forces; Cold plates; Cooling; Electronic packaging thermal management; Integrated circuit interconnections; Microassembly; Resistance heating; Thermal force; Thermal resistance; Wire;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1985.1136538
  • Filename
    1136538