• DocumentCode
    968585
  • Title

    Fault detection in combinational networks by Reed-Muller transforms

  • Author

    Damarla, T. Raju ; Karpovsky, M.

  • Author_Institution
    Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
  • Volume
    38
  • Issue
    6
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    788
  • Lastpage
    797
  • Abstract
    A new approach for fault detection in combinational networks based on Reed-Muller (RM) transforms is presented. An upper bound on the number of RM spectral coefficients required to be verified for detection of multiple stuck-at-faults and single bridging faults at the input lines of an n-input network is shown to be n. The time complexity (time required to test a network) for detection of multiple terminal faults and the storage required for storing the test are determined. An upper bound is found for the minimum number of test patterns required to detect a fault. The authors present standard tests based on this result, with a simple test generation procedure and upper bounds on minimal numbers of test patterns
  • Keywords
    combinatorial circuits; computational complexity; logic testing; Reed-Muller transforms; combinational networks; fault detection; multiple stuck-at-faults; single bridging faults; test generation; test patterns; time complexity; upper bound; Boolean functions; Data compression; Fault detection; Fault diagnosis; Hardware; Intelligent networks; Sparse matrices; Test pattern generators; Testing; Upper bound;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.24287
  • Filename
    24287