Title :
Stability of Nickel-Chromium Thin Film Resistors
Author :
Ahern, James ; Heid, Kermit
Author_Institution :
Trans-A-File Systems,Sunnyvale, California
fDate :
6/1/1972 12:00:00 AM
Abstract :
This study explores the major factors which may affect the stability of thin film nickel-chromium resistors. These factors include annealing temperatures, manufacturing processes, form factors, power density, and trimming. The results of a 1000-hour load life study are given in terms of these same major factors.
Keywords :
Annealing; Assembly; Circuit testing; Manufacturing processes; Resistors; Stability; Substrates; Temperature; Transistors; Vacuum systems;
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
DOI :
10.1109/TPHP.1972.1136569
