• DocumentCode
    968778
  • Title

    t-TDA-diagnosable systems

  • Author

    Chu, S.-C. ; Armstrong, J.R.

  • Author_Institution
    Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    38
  • Issue
    6
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    914
  • Lastpage
    920
  • Abstract
    A testable diagnosis array (TDA) is proposed for carrying out system-level fault diagnosis (based on the PMC model) centrally and in a non-hard-core manner. This diagnostics device is constructed with simple reliable logic cells. A characterization of t-TDA-diagnosable systems, based on an algebraic relationship between the testing graph Tn of a system of n component and its corresponding TDA, is given. It is shown that the TDA performs the diagnosis correctly and reaches its stable state in a number of clock periods related to the t-diagnostic diameter of T. A special class of t-TDA-diagnosable systems is defined, and an example from that class is used to illustrate the diagnosability of a system using a TDA
  • Keywords
    fault location; fault tolerant computing; logic testing; TDA; diagnosability; diagnostics device; system-level fault diagnosis; testable diagnosis array; testing graph; Circuit faults; Clocks; Computer science; Fault diagnosis; Hardware; Logic arrays; Logic devices; Logic testing; Multiprocessing systems; System testing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.24306
  • Filename
    24306
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=968778