• DocumentCode
    968804
  • Title

    Degradation mechanism of Nb3Sn composite wires under tensile strain at 4.2K

  • Author

    Luhman, Thomas ; Suenaga, M. ; Welch, D.O. ; Kaiho, K.

  • Author_Institution
    IEEE TMAG
  • Volume
    15
  • Issue
    1
  • fYear
    1979
  • fDate
    1/1/1979 12:00:00 AM
  • Firstpage
    699
  • Lastpage
    702
  • Abstract
    Bronze-processed Nb3Sn composite wire conductors exhibit changes in their superconducting parameters when strained in tension. This paper describes a detailed study of the effect of strain on critical current and an analysis by optical and SEM techniques of crack formation in the Nb3Sn layer under strain. The effect of strain history on both reversible and irreversible changes in critical current and the roles of differential thermal contraction induced residual strains and of Nb3Sn cracking are discussed.
  • Keywords
    Mechanical factors; Superconducting materials; Capacitive sensors; Conductors; Degradation; Magnetic field induced strain; Niobium; Niobium-tin; Scanning electron microscopy; Strain measurement; Tensile strain; Wires;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1979.1060068
  • Filename
    1060068