A Near-Field Probe for In Situ EMI Measurements of Industrial Installations

In this paper, we present a frequency-selective probe intended to measure E and H fields simultaneously in the near-field region. The probe is implemented on a printed circuit board (PCB) that provides some advantages compared to those presented in previous works. The existing theoretical models are adapted in order to include the effect of both PCB trace and dielectric support. The probe is used for in situ electromagnetic compatibility (EMC) characterization of industrial installations, which offers valuable information that cannot be obtained by the usual EMC measurements.