Title :
The development of device lithography
Author :
Herriott, Donald R.
Author_Institution :
Perkin-Elmer Corporation, Norwalk, CT
fDate :
5/1/1983 12:00:00 AM
Abstract :
Lithography has been the principal pacing element in the development of complex integrated circuits. Although major programs in electron-beam lithography and X-ray lithography have developed new systems with smaller feature capability, the optical systems remain the only candidates for large-volume device production. Scanning and step-and-repeat optical systems have been developed for the next generation of devices with 1-µm features. Electron beams are used for mask fabrication and direct exposure of special devices of exceptional value or for prototypes. X-ray and ion systems are being developed for future devices.
Keywords :
Conducting materials; Costs; Electron optics; Integrated circuit interconnections; Optical devices; Particle beam optics; Printing; Resists; Silicon; X-ray lithography;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1983.12639