• DocumentCode
    969381
  • Title

    Computer Simulation for the Conductance of a Contact Interface

  • Author

    Nakamura, Mitsunobu ; Minowa, Isao

  • Author_Institution
    Tamagawa Univ,Tokyo, Japan
  • Volume
    9
  • Issue
    2
  • fYear
    1986
  • fDate
    6/1/1986 12:00:00 AM
  • Firstpage
    150
  • Lastpage
    155
  • Abstract
    With the remarkable increase in the performance of computers, techniques of computer simulation are widely applied. A computer simulation based on the finite element method and Monte Carlo method is applied to the problem of contact, and the conductance of a global model for contact is studied. The model consists of two unit cubes and a random interface between the cubes. More specifically, the two identical uniform conducting cubes are in contact across a pair of adjacent faces through a layer of thickness 2d subdivided into N x N small subsquares of which a randomly selected area fraction f has the same conductivity as the cubes (a clean-contact state), while the remaining area.fraction (1 - f) represents zero conductivity. The conductance of this global model for contact is computed and compared with previously published results. Particularly, when N, d, and f are changed, the behavior of the global conductance is investigated and discussed. It is clearly shown that because of extreme current concentration through the contact area the conductance does not decrease until f becomes close to zero.
  • Keywords
    Admittance measurement; Contacts; FEM; Finite-element method (FEM); Monte Carlo methods; Computational modeling; Computer simulation; Conducting materials; Conductivity; Contact resistance; Finite element methods; Helium; Mechanical factors; Nonhomogeneous media; Nonuniform electric fields;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1986.1136639
  • Filename
    1136639