DocumentCode :
969401
Title :
Practical Adhesion of an Ag - Pd Thick-Film Conductor: An Acoustic Emission Study of Pull Tests-I: Monitoring System and Initial Adhesion
Author :
Whalen, Philip J. ; Blum, John B.
Author_Institution :
Rutgers Univ,Piscataway, NJ
Volume :
9
Issue :
2
fYear :
1986
fDate :
6/1/1986 12:00:00 AM
Firstpage :
161
Lastpage :
167
Abstract :
The practical adhesion of an Ag-Pd thick-film conductor on 96-percent alumina was investigated using an acoustic emission monitoring system with a 90° bent wire pull-test configuration. The strength values were highest when an interlocking interface between the metal and substrate was formed. The fracturing of the different interfaces developed during under-, over-, and optimum firing conditions was distinguishable from the acoustic emission data recorded during the adhesion tests.
Keywords :
Acoustic emission; Thick-film circuit bonding; Acoustic emission; Acoustic testing; Adhesives; Conductors; Frequency; Helium; Ink; Monitoring; Substrates; System testing;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1986.1136641
Filename :
1136641
Link To Document :
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