• DocumentCode
    969455
  • Title

    Design Consideration in High Temperature Analog CMOS Integrated Circuits

  • Author

    Shoucair, F.S.

  • Author_Institution
    Yale University, New Haven, CT, USA
  • Volume
    9
  • Issue
    3
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    242
  • Lastpage
    251
  • Abstract
    The design of CMOS analog integrated circuits to be operated at elevated junction temperatures is discussed. Considerations which have successfully been implemented in the design of basic analog cells for operation over the 25°-250°C range are emphasized. Simple models arc presented along with the temperature dependencies of key design parameters. These models and high-temperature trends represent sufficient information for first-order hand analysis prior to computeraided design.
  • Keywords
    CMOS analog integrated circuits; CMOS integrated circuits, analog; CMOS analog integrated circuits; CMOS technology; MOSFET circuits; Military standards; Semiconductor device modeling; Space exploration; Space technology; Temperature dependence; Temperature distribution; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1986.1136646
  • Filename
    1136646