Title :
Block-replicate chip operation at 250 kHz over the temperature range -25°C to 75°C
Author :
Chang, Christopher T M ; Hubbell, Wayne C. ; Dimyan, Magid Y.
Author_Institution :
Texas Instruments Incorp., Dallas, TX, USA
fDate :
1/1/1979 12:00:00 AM
Abstract :
A block-replicate chip employing asymmetric half-disc propagating elements, pickax replicator, and swap gates was designed and fabricated. One bit per rotating field cycle data rate was accrued for this design through the use of a data merge and one detector. Packaged chips were operated and characterized at 250 kHz over -25 to +75°C temperature range. A composite bias margin of 7 Oe under worst case loading at any given temperature in the temperature range was achieved.
Keywords :
Magnetic bubble memories; Aerospace electronics; Chip scale packaging; Costs; Detectors; Frequency; Helium; Magnetoresistance; Prototypes; Temperature distribution; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1979.1060145