Title :
A simulation study of high-speed silicon heteroemitter bipolar transistors
Author :
Ugajin, Mamoru ; Konaka, Shinsuke ; Yokoyama, Kiyoyuki ; Amemiya, Yoshihito
Author_Institution :
NTT LSI Lab., Kanagawa, Japan
fDate :
6/1/1989 12:00:00 AM
Abstract :
Using a two-dimensional numerical simulator, the upper limit of Si homotransistor cutoff frequency is estimated within the assumed conditions of punchthrough voltage. The potential speed advantages of silicon heteroemitter bipolar transistors (Si HBTs) (such as low emitter storage time, low emitter-base junction capacity, and possibility for large base width reduction) are shown by comparing Si HBTs with a Si homotransistor. It is confirmed that the cutoff frequency is enhanced from 48 to 127 GHz by the Si HBT structure. The optimum values of heteromaterial properties for high-speed HBT operation including energy gap, band discontinuity, and heterointerface recombination are discussed
Keywords :
bipolar integrated circuits; bipolar transistors; elemental semiconductors; semiconductor device models; semiconductor technology; silicon; solid-state microwave devices; 48 to 127 GHz; EHF; HBT structure; SHF; Si heteroemitter bipolar transistors; Si homotransistor; band discontinuity; base width reduction; cutoff frequency enhancement; emitter storage time; emitter-base junction capacity; energy gap; heteroemitter bipolar transistors; heterointerface recombination; heteromaterial properties; high-speed HBT operation; optimum values; punchthrough voltage; semiconductors; speed advantages; two-dimensional numerical simulator; Bipolar transistors; Cutoff frequency; Frequency estimation; Heterojunction bipolar transistors; High speed integrated circuits; Integrated circuit technology; Large scale integration; Numerical simulation; Silicon; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on