• DocumentCode
    969785
  • Title

    A simulation study of high-speed silicon heteroemitter bipolar transistors

  • Author

    Ugajin, Mamoru ; Konaka, Shinsuke ; Yokoyama, Kiyoyuki ; Amemiya, Yoshihito

  • Author_Institution
    NTT LSI Lab., Kanagawa, Japan
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    1102
  • Lastpage
    1109
  • Abstract
    Using a two-dimensional numerical simulator, the upper limit of Si homotransistor cutoff frequency is estimated within the assumed conditions of punchthrough voltage. The potential speed advantages of silicon heteroemitter bipolar transistors (Si HBTs) (such as low emitter storage time, low emitter-base junction capacity, and possibility for large base width reduction) are shown by comparing Si HBTs with a Si homotransistor. It is confirmed that the cutoff frequency is enhanced from 48 to 127 GHz by the Si HBT structure. The optimum values of heteromaterial properties for high-speed HBT operation including energy gap, band discontinuity, and heterointerface recombination are discussed
  • Keywords
    bipolar integrated circuits; bipolar transistors; elemental semiconductors; semiconductor device models; semiconductor technology; silicon; solid-state microwave devices; 48 to 127 GHz; EHF; HBT structure; SHF; Si heteroemitter bipolar transistors; Si homotransistor; band discontinuity; base width reduction; cutoff frequency enhancement; emitter storage time; emitter-base junction capacity; energy gap; heteroemitter bipolar transistors; heterointerface recombination; heteromaterial properties; high-speed HBT operation; optimum values; punchthrough voltage; semiconductors; speed advantages; two-dimensional numerical simulator; Bipolar transistors; Cutoff frequency; Frequency estimation; Heterojunction bipolar transistors; High speed integrated circuits; Integrated circuit technology; Large scale integration; Numerical simulation; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.24354
  • Filename
    24354