Title :
Fault detection in combinational circuits using Gunn effect logic devices
Author :
Saluja, K.K. ; Lidgey, F.J.
Author_Institution :
University of Newcastle, Department of Electrical & Computer Engineering, Newcastle, Australia
Abstract :
It is shown that certain realisations of combinational switching functions using Gunn effect logic gates can be tested for single or multiple stuck-type faults by using two tests only. This result is achieved by exploiting the fact that the function of Gunn effect logic gates is sensitive to bias voltage
Keywords :
Gunn devices; combinatorial circuits; fault location; logic gates; Gunn effect logic devices; bias voltage; combinational circuits; fault detection;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810157
