• DocumentCode
    969921
  • Title

    Collector-base junction avalanche effects in advanced double-poly self-aligned bipolar transistors

  • Author

    Lu, Pong-Fei ; Chen, Tze-Chiang

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    1182
  • Lastpage
    1188
  • Abstract
    Observation of base-current reversal induced by avalanche multiplication is reported in advanced self-aligned bipolar devices at a collector junction reverse bias less than 3 V. Temperature measurements were carried out to verify the avalanche mechanism, and the dependence on the collector doping profile and high-level injection effects was investigated both experimentally and by numerical simulations. The avalanche effect, which is expected to aggravate with scaling, will eventually threaten normal circuit operation if certain criteria for base-collector reverse bias cannot be maintained
  • Keywords
    bipolar transistors; elemental semiconductors; semiconductor device models; semiconductor doping; silicon; 3 V; Si; avalanche effect; avalanche mechanism; avalanche multiplication; base-collector reverse bias; base-current reversal; collector base junction avalanche effects; collector doping profile; collector junction reverse bias; double poly bipolar transistors; high-level injection effects; numerical simulations; scaling; self-aligned bipolar transistors; Bipolar transistors; Charge carrier processes; Circuits; Current density; DC generators; Degradation; Doping profiles; Impact ionization; Temperature measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.24366
  • Filename
    24366