DocumentCode :
969921
Title :
Collector-base junction avalanche effects in advanced double-poly self-aligned bipolar transistors
Author :
Lu, Pong-Fei ; Chen, Tze-Chiang
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
36
Issue :
6
fYear :
1989
fDate :
6/1/1989 12:00:00 AM
Firstpage :
1182
Lastpage :
1188
Abstract :
Observation of base-current reversal induced by avalanche multiplication is reported in advanced self-aligned bipolar devices at a collector junction reverse bias less than 3 V. Temperature measurements were carried out to verify the avalanche mechanism, and the dependence on the collector doping profile and high-level injection effects was investigated both experimentally and by numerical simulations. The avalanche effect, which is expected to aggravate with scaling, will eventually threaten normal circuit operation if certain criteria for base-collector reverse bias cannot be maintained
Keywords :
bipolar transistors; elemental semiconductors; semiconductor device models; semiconductor doping; silicon; 3 V; Si; avalanche effect; avalanche mechanism; avalanche multiplication; base-collector reverse bias; base-current reversal; collector base junction avalanche effects; collector doping profile; collector junction reverse bias; double poly bipolar transistors; high-level injection effects; numerical simulations; scaling; self-aligned bipolar transistors; Bipolar transistors; Charge carrier processes; Circuits; Current density; DC generators; Degradation; Doping profiles; Impact ionization; Temperature measurement; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.24366
Filename :
24366
Link To Document :
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