DocumentCode
969921
Title
Collector-base junction avalanche effects in advanced double-poly self-aligned bipolar transistors
Author
Lu, Pong-Fei ; Chen, Tze-Chiang
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
36
Issue
6
fYear
1989
fDate
6/1/1989 12:00:00 AM
Firstpage
1182
Lastpage
1188
Abstract
Observation of base-current reversal induced by avalanche multiplication is reported in advanced self-aligned bipolar devices at a collector junction reverse bias less than 3 V. Temperature measurements were carried out to verify the avalanche mechanism, and the dependence on the collector doping profile and high-level injection effects was investigated both experimentally and by numerical simulations. The avalanche effect, which is expected to aggravate with scaling, will eventually threaten normal circuit operation if certain criteria for base-collector reverse bias cannot be maintained
Keywords
bipolar transistors; elemental semiconductors; semiconductor device models; semiconductor doping; silicon; 3 V; Si; avalanche effect; avalanche mechanism; avalanche multiplication; base-collector reverse bias; base-current reversal; collector base junction avalanche effects; collector doping profile; collector junction reverse bias; double poly bipolar transistors; high-level injection effects; numerical simulations; scaling; self-aligned bipolar transistors; Bipolar transistors; Charge carrier processes; Circuits; Current density; DC generators; Degradation; Doping profiles; Impact ionization; Temperature measurement; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.24366
Filename
24366
Link To Document