Title :
An automated system for measurement of random telegraph noise in metal-oxide-semiconductor field-effect transistors
Author :
Hung, K.K. ; Ko, P.K. ; Hu, C. ; Cheng, Y.C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fDate :
6/1/1989 12:00:00 AM
Abstract :
A computer-controlled system for measuring the random telegraph noise in small-area MOSFETs is described. The key element is a specially designed current amplifier that employs a feedback technique to separate the fluctuating and DC parts of the drain current. Techniques for automatic extraction of the fluctuation amplitude and time constants from the raw data are also discussed
Keywords :
amplifiers; computerised instrumentation; electron device noise; feedback; insulated gate field effect transistors; measurement systems; random noise; automated system for measurement; automatic extraction; computer-controlled system; current amplifier; drain current; feedback technique; fluctuation amplitude; metal-oxide-semiconductor field-effect transistors; random telegraph noise; small-area MOSFETs; time constants; 1f noise; Bipolar transistors; Circuit noise; FETs; MOSFETs; Monitoring; Noise measurement; Semiconductor device noise; Telegraphy; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
