DocumentCode :
970294
Title :
An Analysis of Current Crowding at 180° Bends in Film Resistors
Author :
Barlage, F.
Author_Institution :
Western Electric, OH
Volume :
9
Issue :
4
fYear :
1973
fDate :
12/1/1973 12:00:00 AM
Firstpage :
262
Lastpage :
263
Keywords :
Laser machining; Tantalum nitride films; Thin-film resistors; Current density; Manufacturing processes; Optical design; Optical materials; Power lasers; Proximity effect; Resistors; Substrates; Thermal resistance; Transistors;
fLanguage :
English
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0361-1000
Type :
jour
DOI :
10.1109/TPHP.1973.1136731
Filename :
1136731
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=970294
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