DocumentCode :
970325
Title :
VISTA-user interface, task level, and tool integration
Author :
Halama, Stefan ; Pichler, Christoph ; Rieger, Gerhard ; Schrom, Gerhard ; Simlinger, Thomas ; Selberherr, Siegfried
Author_Institution :
Inst. for Microelectron., Tech. Univ. Wien, Austria
Volume :
14
Issue :
10
fYear :
1995
fDate :
10/1/1995 12:00:00 AM
Firstpage :
1208
Lastpage :
1222
Abstract :
Succeeding an earlier paper on the data level, the Viennese Integrated System for Technology CAD Applications (VISTA), an integration and development system for Technology CAD, is presented. Starting with a short overview of TCAD methodology and existing integrated systems, portability and comprehensibility are postulated as key considerations and an application-framework architecture is proposed. The design of VISTA´s user interface and task level, presented next, adheres strictly to these guidelines. To enable the cooperation of independent simulation tools, an automatic triangulation-based service is provided by VISTA to resolve inconsistencies in wafer representations. A final example shows how three different simulators, integrated by the framework are used to simulate a planarized, trench-isolated 0.25 μm CMOS process
Keywords :
CAD; semiconductor process modelling; user interfaces; 0.25 micron; VISTA; Viennese Integrated System for Technology CAD Applications; application-framework architecture; automatic triangulation; comprehensibility; development system; planarized trench-isolated CMOS process; portability; simulation; task level; tool integration; user interface; wafer representation; Application software; CMOS process; CMOS technology; Computational modeling; Delay; Design automation; Fabrication; Guidelines; Paper technology; User interfaces;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.466337
Filename :
466337
Link To Document :
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