• DocumentCode
    971071
  • Title

    Dynamics of an asymmetric nondestructive read out memory cell

  • Author

    Beha, H.

  • Author_Institution
    Universität Karlsruhe, Germany
  • Volume
    15
  • Issue
    1
  • fYear
    1979
  • fDate
    1/1/1979 12:00:00 AM
  • Firstpage
    424
  • Lastpage
    427
  • Abstract
    In single flux quantum interferometer memory cells the information can be stored without bias current, if the interferometer inductance L is chosen sufficiently large ( \\lambda = 2\\pi LI_{0}/\\Phi _{0} = 2\\pi ) to allow for three stable states (-1-, 0-, 1-mode) at zero control and gate current. In this case the binary informations are represented by the -1- and 0-mode of the interferometer. The nondestructive read out operation of a binary "1" is performed without a transition into another mode or into the voltage state. The binary "1" corresponds to no sense signal. Nondestructive read out of the binary "0" is achieved in switching to the voltage state and in returning to the 0-mode after the end of the drive currents. In this paper the dynamics of switching back into the zero voltage state are investigated by simulations of trajectories in the order parameter phase plane. It is shown that for realistic fabrication tolerances the interferometer settles in the wanted 0-mode and not in the -1- or 1-mode even under severe gate or control current disturbs, if the maximum Josephson currents of the two Josephson junctions are unequal (2:1) and if the McCumber damping factor is sufficiently large ( \\beta \\approx 100 ).
  • Keywords
    Josephson device memories; NDRO memories; Damping; Equivalent circuits; Fabrication; Inductance; Josephson effect; Josephson junctions; Laboratories; Prototypes; Random access memory; Zero voltage switching;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1979.1060273
  • Filename
    1060273