Title :
Texture classification by wavelet packet signatures
Author :
Laine, Andrew ; Fan, Jian
Author_Institution :
Dept. of Comput. & Inf. Sci., Florida Univ., Gainesville, FL, USA
fDate :
11/1/1993 12:00:00 AM
Abstract :
This correspondence introduces a new approach to characterize textures at multiple scales. The performance of wavelet packet spaces are measured in terms of sensitivity and selectivity for the classification of twenty-five natural textures. Both energy and entropy metrics were computed for each wavelet packet and incorporated into distinct scale space representations, where each wavelet packet (channel) reflected a specific scale and orientation sensitivity. Wavelet packet representations for twenty-five natural textures were classified without error by a simple two-layer network classifier. An analyzing function of large regularity (D20) was shown to be slightly more efficient in representation and discrimination than a similar function with fewer vanishing moments (D6) In addition, energy representations computed from the standard wavelet decomposition alone (17 features) provided classification without error for the twenty-five textures included in our study. The reliability exhibited by texture signatures based on wavelet packets analysis suggest that the multiresolution properties of such transforms are beneficial for accomplishing segmentation, classification and subtle discrimination of texture
Keywords :
feature extraction; feedforward neural nets; image recognition; wavelet transforms; energy metrics; entropy metrics; orientation sensitivity; scale sensitivity; scale space representations; scale-independence; selectivity; sensitivity; texture classification; two-layer network classifier; wavelet packet signatures; wavelet packet spaces; Biomedical measurements; Computer vision; Extraterrestrial measurements; Feature extraction; Humans; Image texture analysis; Statistics; Wavelet analysis; Wavelet packets; Wavelet transforms;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on