• DocumentCode
    971392
  • Title

    Influence of Non-Uniform Current Distribution on AC Transport Current Loss in Bi-2223/Ag Tapes

  • Author

    Choi, Seyong ; Suh, Su-Jeong ; Nah, Wansoo ; Ma, Yong Ho ; Ryu, Kyung-Woo ; Kim, Jung Ho ; Joo, Jinho ; Sohn, Myung-Hwan ; Kwon, Young-Kil

  • Author_Institution
    Sungkyunkwan Univ., Gyeonggi
  • Volume
    16
  • Issue
    2
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    154
  • Lastpage
    157
  • Abstract
    This paper presents the influence of current distribution on AC transport current loss in multi-strand high-temperature superconductor (HTS) tapes. The current-distribution-dependent-AC loss is analyzed by introducing a current distribution parameter. We calculated AC loss of multi-strand HTS tapes numerically and performed AC loss measurements as well. Though the effect of current distribution on AC transport current loss is relatively insignificant for a low applied transport current, the effect of nonuniform current distribution seriously increases AC loss for a high applied transport current. The AC loss measurement method used in this paper is also confirmed by comparison with numerical results: the experimental and computational results showed good agreement for various current distribution parameters
  • Keywords
    bismuth compounds; current distribution; high-temperature superconductors; loss measurement; numerical analysis; superconducting tapes; AC transport current loss measurement; Bi-2223-Ag tapes; multistrand high-temperature superconductor tape; nonuniform current distribution; numerical analysis; Conductors; Critical current; Current distribution; Current measurement; High temperature superconductors; Loss measurement; Materials science and technology; Performance evaluation; Superconducting materials; Superconductivity; AC transport current loss; Bi-2223/Ag tape; nonuniform current distribution;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2006.870821
  • Filename
    1642814