DocumentCode :
971752
Title :
Low-field low-frequency dispersion of transconductance in GaAs MESFETs with implications for other rate-dependent anomalies
Author :
Ladbrooke, Peter H. ; Blight, Stephen R.
Author_Institution :
GEC Res. Ltd., Wembley, UK
Volume :
35
Issue :
3
fYear :
1988
fDate :
3/1/1988 12:00:00 AM
Firstpage :
257
Lastpage :
267
Abstract :
A theory that emphasizes the role of surface states in the operation of GaAs MESFETs and that is intended to tie together hitherto unconnected anomalies in device behavior is presented. Such undesirable effects are consistent with the DC and microwave characteristics of the FET being modified by charge exchange with surface states. Generally speaking, these states are relatively slow, having characteristics frequencies of typically 1 kHz, but they nevertheless affect the microwave scattering parameters of the FET through the distortion they introduce to the shape of the depletion region in the transistor under given bias conditions. It is argued that the FET structure behaves as natural `probe´ of surface states and so constitutes a useful analytic tool for studying states on a variety of unpassivated and passivated surfaces
Keywords :
III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor device models; solid-state microwave devices; surface electron states; DC characteristics; GaAs; MESFETs; bias conditions; charge exchange; depletion region; low-frequency dispersion; microwave characteristics; microwave scattering parameters; model; rate-dependent anomalies; surface passivation; surface states; transconductance; Frequency; Gallium arsenide; MESFETs; Microwave FETs; Microwave devices; Microwave transistors; Probes; Scattering parameters; Shape; Transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.2449
Filename :
2449
Link To Document :
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