Title :
Separation of bulk lifetime and surface recombination velocity by multiwavelength technique
Author :
Sirleto, L. ; Irace, A. ; Vitale, G.F. ; Zeni, L. ; Cutolo, A.
Author_Institution :
IRECE-Res. Inst. for Electromagnetism & Electron. Components, CNR, Napoli, Italy
fDate :
12/5/2002 12:00:00 AM
Abstract :
A contactless, all-optical and nondestructive technique for simultaneous measurement of minority carrier recombination lifetime and surface recombination velocity, at low injection level, in silicon samples is presented. Being contactless and non-destructive with respect to the surface to be analysed, the method is appealing for routine lifetime characterisation.
Keywords :
carrier lifetime; elemental semiconductors; minority carriers; nondestructive testing; silicon; surface recombination; Si; all-optical technique; bulk lifetime; contactless technique; minority carrier recombination lifetime; multiwavelength technique; nondestructive technique; routine lifetime characterisation; silicon; surface recombination velocity;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20021109
